Broaden your horizons with the new sensofar system S wide
Learn all about the new Sensofar system S wide. This exceptional 3D Optical Profiler expands metrology towards a larger field of view for surface roughness measurement. The S wide integrates the benefits of a digital microscope into a hi-resolution, fast scanning measuring instrument.
The new Sensofar system S wide, improves routine operation through ease of use, with one-shot height measurements up to 40 mm, without Z-scanning
Achievement of sub-micron height repeatability over entire extended area
Color acquisition with the best resolution thanks to the integrated 5Mpx camera
Form deviation from 3D CAD models for an effective integration to daily internal processes