We modify a DMD-based optical profiler to enable lateral super-resolution of the image stack and explore how the quality of the 3D surface [...]
Sensofar’s R&D continues to expand its technical knowledge and metrology system capabilities. This is shown by the ongoing commitment to publish our latest research to the scientific and optical metrology communities. Proof is found in the number of technological publications currently available.
Metrology expertise reflected in our technical and scientific publications
Sensofar R&D is constantly growing its know-how, technology and system capabilities.
These developments are illustrated by Sensofar’s continued commitment within and for the scientific optical metrology community, a proof of this is the number of technological papers that have been developed and published.