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Sensofar Spectroscopic Reflectometry

Spectroscopic Reflectometry measures thin films quickly, accurately, non-destructively and requires no sample preparation.

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Sensofar Spectroscopic Reflectometry

Spectroscopic Reflectometry measures thin films quickly, accurately, non-destructively and requires no sample preparation.

BACKGROUND

Thin film

When a transparent layer is deposited on top of a surface, its reflectivity changes. The system acquires the reflectance spectrum of the sample in the visible range, and is compared with a simulated spectra calculated by the software, with layer thickness modification until the best fit is found. For thin films, the thickness is similar to the light wavelength and we obtain a wavy response of reflectivity along the optical spectrum.

Read our related papers:
Improving the measurement of thick and thin films with optical profiling techniques

Optical stent inspection of surface texture and coating thickness

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KEY FEATURES

Transparent films from 50 nm to 1.5 μm can be measured in less than five seconds with Sensofar Spectroscopic Reflectometry.

  Transparent films from 50 nm to 1.5 μm

  Acquisition in less than 5 seconds

  One objective can cover the complete the range

  Different spot sizes (3.5 μm to 40 μm) 

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SR system

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