The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

SOLUTIONS

Large Area 3D optical Metrology System

 Advanced manufacturing

Archaeology & Paleontology

Consumer electronics

Medical devices

Molding

Optics

Watch industry

S wide system detail

SOLUTIONS

Large Area 3D optical
Metrology System

 Advanced manufacturing

Archaeology & Paleontology

Consumer electronics

Medical devices

Molding

Optics

Watch industry

Advanced manufacturing

Archaeology & Paleontology

Consumer electronics

Medical devices

Molding

Optics

Watch industry

Topography PCB 2D False Color

Sub-micron height repeatability over entire extended area

Topo
Topography PCB 2D False Color

Sub-micron height repeatability over entire extended area

Topo
Topography Progressive lenses 2D false color

One shot height measurement up to 40 mm without Z scanning

Profile progressive lenses 2D
progressive_lenses_2d_falsecolor_compo

One shot height measurement up to 40 mm without Z scanning

Topography detail chip 2D

Bi-telecentric lenses with very low field distortion providing accurate metrology

Topography chip 3D
Topography detail chip 2D
Topography chip 3D

Bi-telecentric lenses with very low field distortion providing accurate metrology

Topography of the calibration specimen 3D False color

ISO STANDARDS

Traceability

Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards according to ISO 25178 and VDI 2634-2.

Profile calibration specimen 3D
Topography and profile of the calibration specimen 3D False color

ISO STANDARDS

Traceability

Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards according to ISO 25178 and VDI 2634-2.

Additive manufacturing 3D CAD Comparison

Form deviation from 3D CAD models

providing the geometric difference and tolerance measurement

additive_manufacturing_3d_stack
Additive manufacturing 3D CAD Comparison
additive_manufacturing_3d_stack

Form deviation from 3D CAD models

providing the geometric difference and tolerance measurement

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