The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

SOLUTIONS

Large Area 3D optical Metrology System

 Advanced manufacturing

Archaeology & Paleontology

Consumer electronics

Medical devices

Molding

Optics

Watch industry

SOLUTIONS

Large Area 3D optical
Metrology System

 Advanced manufacturing

Archaeology & Paleontology

Consumer electronics

Medical devices

Molding

Optics

Watch industry

Advanced manufacturing

Archaeology & Paleontology

Consumer electronics

Medical devices

Molding

Optics

Watch industry

Sub-micron height repeatability over entire extended area

Sub-micron height repeatability over entire extended area

One shot height measurement up to 40 mm without Z scanning

One shot height measurement up to 40 mm without Z scanning

Bi-telecentric lenses with very low field distortion providing accurate metrology

Bi-telecentric lenses with very low field distortion providing accurate metrology

ISO STANDARDS

Traceability

Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards according to ISO 25178 and VDI 2634-2.

ISO STANDARDS

Traceability

Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards according to ISO 25178 and VDI 2634-2.

Form deviation from 3D CAD models

providing the geometric difference and tolerance measurement

Form deviation from 3D CAD models

providing the geometric difference and tolerance measurement

Contact Us

How can we help?