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The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

S wide system detail

SOLUTIONS

Large Area 3D Optical Metrology System

   Advanced manufacturing
  Archaeology & Paleontology
  Consumer electronics
  Medical devices
  Molding
  Optics
  Watch industry

SOLUTIONS

Large Area 3D Optical Metrology System

   Advanced manufacturing
  Archaeology & Paleontology
  Consumer electronics
  Medical devices
  Molding
  Optics
  Watch industry

Topography PCB 2D False Color

Sub-micron height repeatability over entire extended area

Topo
Topography PCB 2D False Color

Sub-micron height repeatability over entire extended area

Topo
Topography Progressive lenses 2D false color

One shot height measurement up to 40 mm without Z scanning

Profile progressive lenses 2D
progressive_lenses_2d_falsecolor_compo

One shot height measurement up to 40 mm without Z scanning

Topography detail chip 2D

Bi-telecentric lenses with very low field distortion providing accurate metrology

Topography chip 3D
Topography detail chip 2D
Topography chip 3D

Bi-telecentric lenses with very low field distortion providing accurate metrology

Additive manufacturing 3D CAD Comparison

Form deviation from 3D CAD models

providing the geometric difference and tolerance measurement

additive_manufacturing_3d_stack
Additive manufacturing 3D CAD Comparison
additive_manufacturing_3d_stack

Form deviation from 3D CAD models

providing the geometric difference and tolerance measurement

Traceability

TRACEABILITY

Calibration of surface texture measuring instruments

All our systems are manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards following the ISO 25178 guidelines of part 7 for: Z amplification factor, XY lateral dimensions, flatness error, as well as parcentricity and parfocality.

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