Control of production PLu Series have been specially designed for fast optical characterization of large samples like panels containing PCBs, Vias, flip-chip and traces analysis. Based on the well proven Sensofar’s optical profiling technology, you can now profile any surface with Interferometry techniques (PLu 4300 CP) or the combination of both Confocal and Interferometry techniques (PLu 2300 CP).

New stage design based on a gantry granite platform, the stage is able to accommodate up to 610x610mm samples. Multiple fixture and holder types offer wide range of possibilities to inspect different samples: from large panels (like PCBs) to several flip-chips, allowing the system to inspect and automatically report Via, Anchor, S/R and Trace dimensions.

• Large sample size: • Up to 610 x 610 mm
• Fast and reliable Non-contact 3D measuring and inspection
• Fully automated acquisition and analysis
• Highest throughput for in-line process control