SENSOFAR is a leading-edge technology company operating at the highest quality standards within the field of non contact surface metrology. We provide high-accuracy optical profilers based on interferometry and confocal techniques.
From standard setups for R&D and quality inspection laboratories, to complete non contact metrology solutions for online production processes, Sensofar is offering a technology enabling our customers to achieve the most challenging breakthroughs, particularly in semiconductor, precision optics, data storage, display devices, thick and thin films and material testing technologies, in more than 15 countries.
New Product: PLu APEX
PLu apex. Aspheric Optical Profiler
The PLu apex is an optical profiler capable of measuring any optical surface from aspheric to flat or free-form. This is especially helpful when measuring optics. Its innovative design, based on Sensofar's confocal Tracking™ technology allows non-contact high precision fast measurement of 1 mm/s.
It is equipped with a high-precision air bearing stage and a powerful aspheric curve analysis software as well as a fast, easy to use alignment technology.
The new PLu apex is able to meet the most demanding metrology requirements for large samples with a measurement range up to 100 mm (optionally up to 500 mm) and up to 50 mm Z measurement range and up to 65º slope angle.
Non-contact metrology plays a key role in aspheric and free-form optics manufacturing industries. This holds true for mass production of Blu-ray and DVD lenses, cellphone, PDA camera lenses, digital cameras, projectors lenses. It is especially critical for high precision applications such us astronomical instrumentation, optical data storage and photolithography.
Sensofar-Tech and Leica Microsystems Expand Cooperation Agreement in Innovative Surface Metrology.
<Terrassa (Barcelona) Oct 2010>
Terrassa, Spain / Heerbrugg, Switzerland. Sensofar-Tech, Terrassa, Spain and Leica Microsystems (Schweiz AG) have agreed to expand their cooperation whereby Sensofar is to supply technology and components for an optical system that complements Leica's line of products for industrial applications. Leica Microsystems will utilize the Sensofar technology plus Leica Microsystems' high-end optical objectives to provide a new and complete solution for sophisticated optical profiling and 3D surface metrology with a vertical accuracy down to 0.1nm.
The Leica DCM 3D Measuring Microscope combines confocal microscopy and interferometry in one sensor head, providing ultrafast and non-contact analysis of the micro- and nanogeometry of material surfaces to an accuracy of 0.1 nanometer.
