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PLu 1300 (Portable)
PLu 2300 (General Purpose)
PLu 4300 (High End)
Core Technology

Interferometry & Confocal

Confocal & Interferometry

Interferometry & Spectroscopic Reflectometry

Field of applications
Rolls and Heavy components
General Purpose, R&D, Industrial Applications
R&D, Control of Production, Thin Film
Vertical Scan
100 um
30 mm
50 mm
FOV
From 3.5 mm to 0.1 mm
From 5 mm to 0.05 mm
From 5 mm to 0.2 mm
Highlights

Portable, lightweight (4.5 Kg). Fast and fully automatic (one push button to red/green lights)

Microdisplay Confocal Microscope for superb, high resolution and stable images. Dual technology for the highest range of 3D Optical Profiling applications
Dual vertical scanner and dual technology for 3D optical profiling and Thin Film measures with the highest lateral resolution
 
         

PLu 1300
Portable Optical Profiler
Portable and extremely light (4.5 Kg). The Sensofar’s PLu 1300 is the perfect optical profiler for measuring large and/or heavy samples that cannot be placed under a table-top profiler, such as steel rolls or plates. With autofocus capability, the PLu1300 enables accurate and cost-effective metrology for the Steel, Paper and Printing Industries, using Sensofar's patented arrangement of Confocal and Interferometry techniques in asingle head.

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PLu 2300
Optical Imaging Profiler
The unique Dual Technology sensor head combining Confocal and Interferometry techniques on the same system. Just by selecting the objective, the Plu 2300 is able to perform standard microscope imaging, confocal imaging, confocal profiling, PSI and VSI. The widest range of applications can be solved with this compact and robust instrument, with high speed and high repeatability measurements from the micro to the sub-nanometer scale.

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PLu 4300
3D Optical Profiler, High resolution thin film metrology The Sensofar’s PLu 4300 is an optical profiler for the 3D measurement of surfaces and thin films. The unique combination of Interferometry optical profiling and Spectroscopic Reflectometry on a single head makes the PLu 4300 the only system in the market able to measure 3D profiles, roughness and thickness of opaque and transparent materials with sub-nanometer resolution.

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Plu CP
Control of Production PLu series Control of production PLu series have been specially designed for fast characterization of large samples like PCBs, Vias, flip-chip and traces analysis. Based on the well proven Sensofar's optical profiling technology, you can now profile any surface integrating the Plu 4300 or the Plu 2300. Your solution for large-format applications.

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Thin Film
Thin Film metrology products are intended to measure thin material depositions. The core technology is based on Spectroscopic Reflectometry and Ellipsometry, being able to measure material thickness up to several layers and different materials.

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SensoMAP
SensoMAP is advanced analysis software. It can be used separately or jointly with all the PLu’s series to automatically report. Unique features, like compliance with non-measured points, advanced 3D analysis , and constantly up to date ISO normative, makes the perfect tool for data analysis and reporting.

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    SensoMAP  
         
         

SensoPRO
SensoPRO is the advanced automatic software directly linked to a PLu system. Every analysis procedure is custom programmed to the industry needs to achieve the proper quality or production control.

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    SensoMAP  
         
         

Custom
Can't you find the perfect solution for your application? Sensofar develops custom solutions were customer needs do not match with standard products. Our expertise in optical metrology and project development, as well as multiple custom applications developed for the most wide range of industries, will bring you the perfect matching solution!

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  Sensofar-Tech, S.L.
T: +34 93 739 89 45
info@sensofar.com
   
   
   
   
  Fairs
 
  NANOTECH 2009
18. - 20.02.2009
Tokio Bigsight, Japan www.nanotechexpo.jp
   
   
 
  FINETECH 2009
15. - 17.04.2009
Tokio, Japan www.eventseye.com
   
   
 
  Control 2009
05. - 08.05.2009
Stuttgart, Germany
www.control-messe.com
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