Precision 3D metrology for semiconductor manufacturing – video recording
While the semiconductor industry continues to push the limits of device performance and miniaturization, 3D metrology remains essential for achieving consistent yield, reliable quality, and faster time-to-market.
In this webinar, discover how 3D optical metrology meets the challenges posed by both front-end and back-end semiconductor manufacturing. You’ll learn about cutting-edge automation for in-line inspection, best practices for advanced packaging and heterogeneous integration evaluation, and real-world applications from wafer-level testing to final device verification.
Join us to see how Sensofar’s metrology solutions can help keep you ahead in the rapidly evolving semiconductor landscape.
Watch the webinar
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