
APR board
SEMICONDUCTOR
SEMICONDUCTOR
Evaluates surface topography by extracting key parameters such as peak-to-valley height, peak and valley volumes, and Sa values. It enables evaluation of individual surface features using user-defined thresholds to selectively analyze peaks and valleys, improving accuracy and control over the results.
Evaluates surface topography by extracting key parameters such as peak-to-valley height, peak and valley volumes, and Sa values. It enables evaluation of individual surface features using user-defined thresholds to selectively analyze peaks and valleys, improving accuracy and control over the results.








