TRIM TWO LEVELS

Provides step-height analysis across multiple levels on semiconductor wafers, allowing consistent evaluation of varying step structures within a single workflow.

COLOR COORDINATES

This plugin provides an evaluation of crystal shape, size, position, circularity, and color. In addition, user-defined thresholds enable efficient particle filtering, improving analysis accuracy [...]

APR BOARD

This plugin enables evaluation of individual surface features using user-defined thresholds to selectively analyze peaks and valleys, improving accuracy and control over the results.

PI TRIM

This plugin is designed for wafer applications that focuses on key dimensional parameters, primarily the distance between stacked features and the total feature height, enabling accurate control [...]

WAFER ADHESIVE

This plugin is developed for semiconductor applications to characterize adhesive traces on wafers. It focuses on critical parameters such as glue trace width and adhesive height relative to the [...]

POCKET SPHERE

This plugin is designed for the analysis of semiconductor structures featuring a convex spherical element within a cavity. It provides precise geometric evaluation of key parameters.

TB GLUE

TB Glue is a new plugin developed for wafer applications to evaluate adhesive deposition on silicon-based surfaces. It focuses on key height parameters, including minimum, maximum, and average [...]

GRADIENT SLOPE

This plugin is developed for semiconductor applications to characterize step transitions and inclined features. It provides key parameters such as step height, bottom height reference, projected [...]

BALL STITCH