SENSOFAR’s USERS PAPERS
Sensofar’s users papers
Sebastian Pankalla, Ramkumar Ganesan, Dieter Spiehl, Hans Martin Sauer, Edgar Dorsam, M. Glesner - Organic Electronics Volume 14, Pages 676-681
Jakub Brezina, Janette Brezinova, Jan Vinas - Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum Volume 405, Pages 171-178
S.V. Sibileva, Andrey Leonidovich Botanogov, Nikolay Vadimovich Trofimov, Ludmila Viktorovna Zaharova - Advanced materials research Volume 1101, Pages 229-232
Daan van den Ende, J.-D. Kamminga, Arjen Boersma, Thomas Andritsch, Peter G. Steeneken - Advanced Materials Volume 25, Pages 3438-3442
Marius Bodor, Aurora LasagabasterLatorre, Goretti AriasFerreiro, Sonia Dopico, M. J. Abad - Polymers Volume 16, Pages 977-977
Saeed Khademzadeh, Simone Carmignato, Nader Parvin, Filippo Zanini, P.F. Bariani - Materials Design Volume 90, Pages 745-752
Francisco RomeroGavilan, Nuno AraujoGomes, Andreia Cerqueira, Inaki GarciaArnaez, Cristina MartinezRamos, Mikel Azkargorta, Ibon Iloro, Felix Elortza, M. Gurruchaga, J. Suay, I. Goni - JBIC Journal of Biological Inorganic Chemistry Volume 24, Pages 563-57
Roland A. Terborg, Juan P. Torres, Valerio Pruneri - Optics Express Volume 26, Pages 28938-28938
Enrico Massa, Carlo Paolo Sasso, Matteo Fretto, Martino Lobue, G. Mana - Journal of Applied Crystallography Volume 53, Pages 1195-1202
Guiomar Riu Perdrix, Sebastian Slawik, Frank Mucklich, L. Llanes, J.J. Roa - Metals Volume 14, Pages 52-52
Konrad Tobota, Marcin Chmielewski, Jan Dusza - Welding Technology Review Volume 92, Pages 15-23
Petr Hermanek, Simone Carmignato - Case Studies in Nondestructive Testing and Evaluation Volume 6, Pages 122-127
M.A. Mekicha, M.B. de Rooij, D.T.A. Matthews, C.G.N. Pelletier, L. Jacobs, Dirk J. Schipper - Tribology International Volume 142, Pages 106003-106003
Herman Pontzer, Jessica R. Scott, David Lordkipanidze, Peter S. Ungar - Journal of Human Evolution Volume 61, Pages 683-687
Mangirdas Malinauskas, Holger Gilbergs, Vytautas Purlys, Andrius Zukauskas, Marius Rutkauskas, R. Gadonas - Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Volume None
