Start typing and press Enter to search

This website does not support Internet Explorer. For a correct visualization we recommend to use Microsoft Edge or Google Chrome.

Webinars & Talks

Quantitative measurement & automated bullet comparison using HR optical 3D surface metrology

Webinars & talks
Vice-president Software, Ph.D. in Physics (Optical Engineering), Technical Engineering in Telecommunications, Electronic Engineering at Sensofar Metrology | Other articles

Partner at Sensofar since 2004.
Experienced Research & Development Specialist, Cristina works at CD6 as R&D Engineer since 1996 and she is Software Manager at Sensofar Tech SL since it’s foundation in 2001 and VP Software since 2017. The research interests include optical metrology, surface metrology, image processing and computing sciences. Since 2010 she is developing the use of three-dimensional (3D) topographical analysis in firearms analysis.

In order to further that effort, we will present a method for making accurate topographic measurements of bullet land surfaces, along with a methodology to extract individual characteristics and calculate a composite comparison score between two bullets.

This makes it possible to automatically process large batches of bullets for comparison and provide the examiners with a list of probable bullet matches by applying filtering criteria on comparison scores.

Register to watch the webinar

 agree to process my data to respond to the request for information. (*)


* DATA CONTROLLERSENSOFAR-TECH, SL. PURPOSE:  Attend to the user's request  LEGITIMATION: Consent of the interested party. ASIGNMENTSYour data will not be ceded to third parties except if there is a legal obligationand will be kept as long as you do not request its cancellation. RIGHTS: you can exercise the rights of access, rectification, portability and opposition, or if applicable, to the limitation and/or cancellation of the processing. If you consider that the treatment does not comply with current regulations, you can submit a claim to the Control Authority (www.aepd.es). ADDITIONAL INFORMATIONPrivacy Policy.

Dental implants webinarOptical metrology solutions for semiconductors