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Optical system for the measurement of the surface topography of additively manufactured parts

Optical Metrology
F&E-Techniker, BSc in Physik, MSc in Photonik at Sensofar Metrology | Other articles

Pol stieß im Rahmen des Praktikums für seinen Bachelor zu Sensofar. Seither ist er in der F&E-Abteilung tätig. Er prüft die messtechnische Leistung der Systeme von Sensofar, entwickelt neue Algorithmen für optische Techniken und verbessert die bestehende Technologien. Derzeit promoviert er an der Polytechnischen Universität von Katalonien (UPC) in Zusammenarbeit mit Sensofar über ultraschnelle optische Sensoren für die Oberflächenmesstechnik. Seine Hauptforschungsinteressen sind optisches Design und optische Metrologie.

Optical system for the measurement of the surface topography of additively manufactured parts
Narcís Vilar, Roger Artigas, Carlos Bermudez, Adam Thompson, Lewis Newton, Richard K Leach, Marti Duocastella and Guillem Carles


Additive manufacturing is now regularly used for customised fabrication of parts with complex shapes and geometries. However, the large range of relevant scales, high slopes, step-like transitions, undercuts, alternation between dark and overly bright regions and other complex features present on the surfaces, in particular of metal additive parts, represent a significant challenge for current optical measurement technologies. Measuring surfaces with such complex features requires high numerical aperture optics, and state-of-the-art systems commonly include optics that can only reliably acquire surface topographies over a small field of view, typically tens or hundreds of micrometers. Such measurements are often insufficient for practical applications. Here, we present an optical system that features a large numerical aperture (>0.3) and a wide field of view (2.9 x 2.9) mm, capable of measuring additive manufacturing parts in a single measurement, without the need for lateral stitching to increase the field of view. The proposed system exhibits optical properties that provide facility for large-field, high-resolution measurement of industrially-produced additively manufactured parts.

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