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Optical system for the measurement of the surface topography of additively manufactured parts

Optical metrology
研发技术员,物理学学士,光子学硕士 at Sensofar Metrology | Other articles

Pol 在修习学士学位期间的一次实习中加入了 Sensofar。自那时起,他便一直在研发部门工作,负责测试 Sensofar 系统的测量性能、开发新的光学技术算法以及改进现有算法。目前,他正在与 Sensofar 有合作关系的加泰罗尼亚理工大学 (UPC) 攻读工业博士学位,研究用于表面测量的超快光学传感器。他的主要研究方向为光学设计和光学测量。

Optical system for the measurement of the surface topography of additively manufactured parts
Narcís Vilar, Roger Artigas, Carlos Bermudez, Adam Thompson, Lewis Newton, Richard K Leach, Marti Duocastella and Guillem Carles

Abstract

Additive manufacturing is now regularly used for customised fabrication of parts with complex shapes and geometries. However, the large range of relevant scales, high slopes, step-like transitions, undercuts, alternation between dark and overly bright regions and other complex features present on the surfaces, in particular of metal additive parts, represent a significant challenge for current optical measurement technologies. Measuring surfaces with such complex features requires high numerical aperture optics, and state-of-the-art systems commonly include optics that can only reliably acquire surface topographies over a small field of view, typically tens or hundreds of micrometers. Such measurements are often insufficient for practical applications. Here, we present an optical system that features a large numerical aperture (>0.3) and a wide field of view (2.9 x 2.9) mm, capable of measuring additive manufacturing parts in a single measurement, without the need for lateral stitching to increase the field of view. The proposed system exhibits optical properties that provide facility for large-field, high-resolution measurement of industrially-produced additively manufactured parts.

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