Wir haben einen Selbstkorrekturalgorithmus entwickelt, der Nichtlinearitätsfehler im Scanmechanismus der 3D-Mikroskopie erheblich reduzieren kann. Der Ansatz ist insofern rechnerisch [...]

We propose a method for increasing the speed of topographic imaging by orders of magnitude.

We report the implementation of a technique able to reconstruct surface topographies at high resolution, only from the acquisition of a single camera shot, dropping the need to perform an axial [...]

We present an optical system that features a large numerical aperture (>0.3) and a wide field of view (2.9 x 2.9) mm, capable of measuring additive manufacturing parts in a single measurement, [...]

We modify a DMD-based optical profiler to enable lateral super-resolution of the image stack and explore how the quality of the 3D surface reconstruction can be improved.

We study how several methods of structured illumination microscopy affect the metrological characteristics of an areal optical profiler.

We try to measure the three dimensional surface texture and shape of aluminium anodized parts with high lateral resolution.

To prove the feasibility of the proposed approach for printing continuous lines free from scalloping and bulging with excellent definition.

We investigate whether a good enough calibration accuracy can be reached to enable a useful calibration of the CSI system.

In this study we compared the results of different optical technologies.

In this paper, we show the development of an Active illumination Focus Variation on an existing confocal microscope using Microdisplay Scanning technology.