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Optical system for the measurement of the surface topography of additively manufactured parts

Optical Metrology
研究開発テクニシャン、物理学理学士、フォトニクス理学修士 at Sensofar Metrology | Other articles

学士号のインターンシップでSensofar入社。以降、Sensofarシステムの測定性能をテストする研究開発部で光学技法のアルゴリズム開発および既存アルゴリズムの改良に携わる。現在、カタルーニャ工科大学(UPC)でSensofarと共同で表面測定の超高速光学センサーに関する産業博士研究を行っている。光学設計と光学式測定を主な研究分野とする。

Optical system for the measurement of the surface topography of additively manufactured parts
Narcís Vilar, Roger Artigas, Carlos Bermudez, Adam Thompson, Lewis Newton, Richard K Leach, Marti Duocastella and Guillem Carles

Abstract

Additive manufacturing is now regularly used for customised fabrication of parts with complex shapes and geometries. However, the large range of relevant scales, high slopes, step-like transitions, undercuts, alternation between dark and overly bright regions and other complex features present on the surfaces, in particular of metal additive parts, represent a significant challenge for current optical measurement technologies. Measuring surfaces with such complex features requires high numerical aperture optics, and state-of-the-art systems commonly include optics that can only reliably acquire surface topographies over a small field of view, typically tens or hundreds of micrometers. Such measurements are often insufficient for practical applications. Here, we present an optical system that features a large numerical aperture (>0.3) and a wide field of view (2.9 x 2.9) mm, capable of measuring additive manufacturing parts in a single measurement, without the need for lateral stitching to increase the field of view. The proposed system exhibits optical properties that provide facility for large-field, high-resolution measurement of industrially-produced additively manufactured parts.

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