Webinar – Broaden your horizons with the new sensofar system, S wide

Learn all about Sensofar’s new exceptional 3D Optical Profiler which expands metrology towards a larger field of view for surface roughness measurement. The S wide integrates the benefits of a digital microscope into a hi-resolution, fast scanning measuring instrument.

Key Topics:

  This new system improve routine operation through ease of use,
with one-shot height measurements up to 40 mm, without Z-scanning

  Achievement of sub-micron height repeatability over entire extended area

  Color acquisition with the best resolution thanks to the integrated 5Mpx camera

  Form deviation from 3D CAD models for an effective integration to daily internal processes

Register and check it out!