S neox Grand Format、应用说明和出版物

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文档

S neox Grand Format 宣传册

应用

我们的产品旨在解决半导体、微电子、光学和表面处理领域的检测要求。我们的产品覆盖了先进制造业和消费电子产品的巨大市场。

案例研究

就地计量学用于CMP中的垫面监测

17 April, 2023 CMP, 案例研究, 消费类电子产品

鉴于CMP过程中表面之间的机械相互作用是该过程所有阶段的关键变量，因此对于CMP过程的表面测量的需求是显而易见的。在整个过程中需要定期进行表征的表面包括调节盘表面、晶圆表面和垫片表面。

膜光子晶体器件的无损表征

20 November, 2019 SMT, 案例研究, 消费类电子产品

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文档

S neox Grand Format 宣传册

应用

PCB

光学部件

刀具

半导体

显示屏幕

电池

集成电路封装

案例研究

就地计量学用于CMP中的垫面监测

表征温度诱导的硅晶片形状和纹理演变

二氧化硅掩膜薄膜的精确厚度测量值

膜光子晶体器件的无损表征

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文档

S neox Grand Format 宣传册

应用

案例研究

解答您的疑问！ 与专家联系

只需给我们发送电子邮件或搜索 您附近的直接联系人即可。

解答您的疑问！ 与专家联系

只需给我们发送电子邮件或搜索 您附近的直接联系人即可。

解答您的疑问！
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