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Sensofar Metrology launches its first Large Area 3D optical Metrology System: S wideNEW

Metrology, Neuigkeiten, Produkte

Sensofar Metrology is proud to announce the release of the next metrology tool for wide areas. The S wide is a high-performance non-contact 3D optical large area metrology system designed for micro-scale measurement, with advanced inspection and analysis capabilities.
The S wide is a dedicated solution designed to rapidly measure large sample areas up to 300 x 300 mm (11.8 x 11.8 in). It provides all the benefits of a digital microscope integrated into a high-resolution measuring instrument. Extremely easy-to-use with one button data acquisition.

chip topography and profile 3d-color

The most significant features are :

   One shot height measurement up to 40 mm without Z-scanning.

   Sub-micron height repeatability over entire extended area.

   Form deviation from 3D CAD models
(providing the geometric difference and tolerance measurement).

   Bi-telecentric lenses with very low field distortion providing accurate metrology.

Topography and profile of the calibration specimen 3D False color

The S wide is intended to the following solutions:

   Advanced manufacturing

   Archaeology & Paleontology

   Consumer electronics

   Medical devices



   Watch industry

The S wide is ideal for all lab environments, without limitations and as sensor in production areas.
Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated and traceable according to the ISO 25178 and VDI2634-2 standards.
The S wide comes with SensoSCAN which drives the system with a clear, intuitive and user-friendly interface and is coupled with new software SensoVIEW for a broad range of analysis tasks. Automated analysis modules have been created to make all QC procedures easier with SensoPRO.

S wide complete system

Further details can be found at

The S wide system was premiered at the upcoming webinar :

Broaden your Horizons with the New Sensofar System, S wide

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