Start typing and press Enter to search

This website does not support Internet Explorer. For a correct visualization we recommend to use Microsoft Edge or Google Chrome.

News

Sensofar’s Vice President participates in the new ISO 25178

Metrology, News, Technology

Dr. Artigas is deeply involved in one of the working groups for the drawing up of the new ISO 25178: Geometrical Product Specification (GPS) – surface texture:Areal. ISO 25178 will be the first international standard taking into account the specification and measurement of 3D surface metrology methods. Significantly, it will incorporate non-contact measurement methods already commonly used by industry, but that have up until now been lacking a standard to support quality audits within the framework of ISO 9000.

The standard has seven chapters, that have been contributed and elaborated upon by a wide range of well reknown scientific institutions such as NIST (National Institute of Standards and Technology), NPL (National Physical Laboratory) and PTB (Physikalisch-Technische Bundesanstalt).

The ISO 25178 includes basic definitions about the 3D measurement and main parameters that can be calculated up to a classification of the different existing technologies. Chapter 6 focuses on the classification of methods and technologies accepted for measuring surfaces and in which Dr. Artigas specifically describes the Imaging Confocal Microscopy (ICM) method.

More information about ISO