SENSOFAR 出版物
出版物
Jiandong Ding, Wanqian Zhang, Xianhua Gao, Hongjie Zhang, Guoyi Sun, Gui Zhang, Xin Li, Haiping Qi, Jingzhen Guo, Qin Li, Daokun Shi, Shi Xiaoli, Haifeng Li, Deyuan Zhang, Wei Guo - Research Square (Research Square) Volume None
Felix Bouchard, Marcos Soldera, Andres Fabian Lasagni - Advanced Optical Materials Volume 11
Maria J.G. Guimarey, Jose M. Lineira del Rio, Josefa Fernandez - Journal of Molecular Liquids Volume 350, Pages 118550-118550
Katherine Booker, Maureen Brauers, Erin Crisp, Shakir Rahman, Klaus Weber, Matthew Stocks, Andrew Blakers - Journal of Micromechanics and Microengineering Volume 24, Pages 125026-125026
Ming Wu, Muhammad Hazak Arshad, Xiaolei Chen, Jun Qian, Dominiek Reynaerts - Procedia CIRP Volume 113, Pages 410-416
Wojciech J. Nowak, Bartek Wierzba, Aleksander Mazurkow, A. Jaworski, ukasz Krawczyk - Journal of Mining and Metallurgy Section B Metallurgy Volume 56, Pages 353-360
L. Palmeira Belotti, J.A.W. van Dommelen, M.G.D. Geers, Constantinos Goulas, Wei Ya, J.P.M. Hoefnagels - Journal of Materials Processing Technology Volume 299, Pages 117373-117373
Rosalia Rementeria, I. Garca, M. M. Aranda, Francisca G. Caballero - Wear Volume 338-339, Pages 202-209
Daniel Nieto, M. T. Flores-Arias, Gerard M. OConnor, Carlos Gomez-Reino - Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Volume None
Razvan Ghinea, Laura I. Ugarte-Alvan, Ana Maria Romero Yebra, Oscar E. Pecho, Rade D. Paravina, Maria del Mar Perez Gomez - Journal of Zhejiang University SCIENCE B Volume 12, Pages 552-562
- CRC Press eBooks Volume None, Pages 325-348
Yanuo Shi, Inigo Garbayo, Jennifer L. M. Rupp - ECS Transactions Volume 68, Pages 2565-2572
Amol Choudhary, J. Cugat, Pradeesh Kannan, R. Sole, Francesc Daz, Magdalena Aguilo, Harold M. H. Chong, D.P. Shepherd - Journal of Physics D Applied Physics Volume 46, Pages 145108-145108
Julia Lehmann, Oliver Bertuch, Reinhard Schneider, Rafaela Debastiani, Christian Greiner - Advanced Engineering Materials Volume 24
Clement Moreau, Julie Lemesle, David Paez Margarit, Francois Blateyron, Maxence Bigerelle - Metrology Volume 4, Pages 141-163
