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寸法

mm (inches)
重量: 5.3 Kg  (11.7 lbs)

S mart sensor dimensions

テクノロジー

光源

icon_WhiteLight

550 nm

対物レンズ性能

Brightfield
MAG 5X 10X 20X 50X 100X
NA 0.15 0.30 0.45 0.80 0.90
WD (mm) 20 15.8 3.0 1.0 1.00
FOV1 (µm) 2826 x 2826 1413 x 1413 707 x 707 283 x 283 141 x 141
空間サンプリング2 (µm) 2.76 1.38 0.69 0.27 0.14
光学分解能3 (µm) 0.94 0.47 0.31 0.18 0.16
システムノイズ4 (nm) 120 45 10 4 3
最大傾斜5 (º) 9 17 27 53 64

1 Maximum field of view with 2/3” camera and 0.25X optics.   2 Pixel size on the surface.   3 L&S: Line and Space, half of the diffraction limit according to the Rayleigh criterion. Values for blue LED in brightfield objectives. 4 Values are assessed through repeated measurements on a reference standard performed under environmentally controlled conditions in accordance with Sensofar’s metrology protocols. 5 On smooth surfaces. Up to 72° on rough surfaces. Other objectives are available.

Interferometry
MAG 2.5X TI 5X MC 10X MC 10X MR 20X MC 20X MR 50X MR 100X MR
NA 0.075 0.14 0.10 0.28 0.10 0.38 0.50 0.70
WD (mm) 10.3 13.0 25.0 8.0 16.7 6.0 3.6 2.0
FOV1 (µm) 5652 x 5652 2826 x 2826 1413 x 1413 1413 x 1413 707 x 707 707 x 707 283 x 283 141 x 141
空間サンプリング2 (µm) 5.52 2.76 1.38 1.38 0.69 0.69 0.27 0.13
光学分解能3 (µm) 2.34 1.25 1.75 0.63 1.75 0.46 0.35 0.25
システムノイズ4 (nm) CSI <1 nm        ePSI   <0.1 nm
最大傾斜5 (º) 4 8 6 16 6 22 30 44

1 Maximum field of view with 2/3” camera and 0.25X optics.   2 Pixel size on the surface.   3 L&S: Line and Space, half of the diffraction limit according to the Rayleigh criterion. Spatial sampling could limit the optical resolution for interferometric objectives. Values for white LED in interferometric objectives. 4 Values are assessed through repeated measurements on a reference standard performed under environmentally controlled conditions in accordance with Sensofar’s metrology protocols.  5 On smooth surfaces.

Z 性能

Z LINEAR STAGE
Vertical range 20 mm (0.79″)
Resolution 5 nm
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ご不明な点がございましたらお問い合わせください。
エキスパートがお答えします。

メールをご送付いただくか
お近くの担当者をお探しください。