SENSOFAR 出版物
出版物
Konrad Tobota, Marcin Chmielewski, Jan Dusza - Welding Technology Review Volume 92, Pages 15-23
Yuichiro Kimura, Motoichi Murakami, Hafedh Bouassida, Yann Tanguy, N. Biboulet, N. Biboulet - SAE technical papers on CD-ROM/SAE technical paper series Volume None
Mohsen Ostad Shabani, J.M. Carrapichano, F.J. Oliveira, R.F. Silva - Wear Volume 384-385, Pages 178-184
Anton Nolvi, Tapani Viitala, Alejandro Garcia Perez, Niklas Sandler, Edward Hggstrom, Carlos Bermudez, Roger Artigas, Ivan Kassamakov - Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Volume 10110, Pages 101100M-
Tereza Krivkova, Antonin Tichy, Hana Tycova, Josef Kucera - Materials Volume 16, Pages 5107-5107
Gang Fu, Shu Beng Tor, N.H. Loh, David E. Hardt - Journal of Micromechanics and Microengineering Volume 20, Pages 085019-085019
Ralf Smeets, Anders Henningsen, Roman Heuberger, Oliver Hanisch, Frank Schwarz, Clarissa Precht - The International Journal of Oral Maxillofacial Implants Volume 34, Pages 329-336
Andreas Mandelis - Review of Scientific Instruments Volume 87
Claudia Carotenuto, Mario Minale - Physics of Fluids Volume 23
Luis A. Navarro, X. Perpina, Philippe Godignon, J. Montserrat, Viorel Banu, M. Vellveh, X. Jorda - IEEE Transactions on Power Electronics Volume 29, Pages 2261-2271
Mangirdas Malinauskas, Holger Gilbergs, Vytautas Purlys, Andrius Zukauskas, Marius Rutkauskas, R. Gadonas - Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Volume None
Zhen Zhang, Jing Ye, Fei Tao, Xiang Ma, Xiaodong Xie, Huihua Huang, Yong Wang - Food Chemistry Volume 286, Pages 29-37
F. Salazar, Francisco del Monte, Javier Garca, Gustavo Ramos - Metrology and Measurement Systems Volume 19
Stefanie Kern, Christine Kern, Mark M. Pradja, RolfAlexander During, Marcus Rohnke - Journal of Applied Polymer Science Volume 138
Laura S. van Hazendonk, Coen F. Vonk, Wilko van Grondelle, Niels H. Vonk, Heiner Friedrich - Applied Materials Today Volume 36, Pages 102014-102014
