
Semicon Europa
Non-contact 3D surface metrology
At Sensofar, we understand the importance of precise and reliable surface metrology in quality assurance, which is why we provide cutting-edge metrology solutions for the manufacturing industry. With a Sales Office in Germany and a global presence, we are committed to delivering innovative systems that enable our customers to improve their production processes and deliver high-quality products.
Our expertise in optical and non-contact measurement technology helps manufacturing professionals overcome even the most challenging surface measurement problems.
Discover how Sensofar can help you optimize your manufacturing processes!
Global Collaborations for European Economic Resilience
SEMICON Europa 2025 is co-located with productronica in Munich, Germany creating the strongest single event for electronics manufacturing in Europe, and broadening the range of attendees across the electronics chain.
Visit us!
Booth
#C1904
18 – 21 Nov
2025
Tue to Fri
9-17h
Messe
München
Products on the show
The S neox is the most versatile 3D optical system in the market. Full capabilities and measurement automation features.
The S lynx 2 is a compact and versatile 3D optical system for roughness, volume, and critical dimensions measurements.
The S wide is designed to measure large areas in one shot, suited for speed and shape measurement applications.
Experience high precision
for large samples
The S neox Grand Format offers a complete solution, from the hardware to the software perspective, for 3D surface measurements of large panels in semiconductor, display, and PCB industries.
Upcoming webinar
Precision 3D metrology for semiconductor manufacturing
In this webinar, discover how 3D optical metrology meets the challenges posed by both front-end and back-end semiconductor manufacturing. You’ll learn about cutting-edge automation for in-line inspection, best practices for advanced packaging and heterogeneous integration evaluation, and real-world applications from wafer-level testing to final device verification.