Start typing and press Enter to search

This website does not support Internet Explorer. For a correct visualization we recommend to use Microsoft Edge or Google Chrome.

Webinars & talks

Broaden your horizons with the new sensofar system S wide

VP Sales, PSDV, MSc in Photonics at Sensofar Metrology | Other articles

Alberto Aguerri has worked at Sensofar since 2004 in different roles in Production and Sales teams. He is a knowledgeable expert of all the optical surface metrology in the market. He is currently leading the worldwide Sales and Applications operations through a network of distributors and own sales and support offices in key markets such as Asia, Germany and USA.

Learn all about the new Sensofar system S wide. This exceptional 3D Optical Profiler expands metrology towards a larger field of view for surface roughness measurement. The S wide integrates the benefits of a digital microscope into a hi-resolution, fast scanning measuring instrument.

KEY TOPICS

  The new Sensofar system S wide, improves routine operation through ease of use, with one-shot height measurements up to 40 mm, without Z-scanning

  Achievement of sub-micron height repeatability over entire extended area

  Color acquisition with the best resolution thanks to the integrated 5Mpx camera

  Form deviation from 3D CAD models for an effective integration to daily internal processes

Register to watch the webinar

 agree to process my data to respond to the request for information.(*)


* DATA CONTROLLERSENSOFAR. PURPOSE:  Attend to the user's request. LEGITIMATION: Consent of the interested party. ASIGNMENTSYour data will not be ceded to third parties except if there is a legal obligationand will be kept as long as you do not request its cancellation. RIGHTS: you can exercise the rights of access, rectification, portability and opposition, or if applicable, to the limitation and/or cancellation of the processing. If you consider that the treatment does not comply with current regulations, you can submit a claim to the Control Authority (www.aepd.es). ADDITIONAL INFORMATIONPrivacy Policy.

Optical metrology solutions for semiconductorsWebinar ISO 25178