Our solutions

General purpose systems

A wide range of non-contact 3D surface profilers are designed to be used in industry and research markets. All of them have been designed as a versatile systems able to measure different textures, structures, roughness and waviness, all across varying surface scales. Sensofar’s General Purpose systems are appropriate for a broad range of high-end surface measurement applications.

Integrable solutions

These integrable solutions put high-performance surface metrology right where you need it: in the application!
Our sensors have been designed right from the outset to be integrated into the harshest manufacturing environments.
Compact, lightweight, and with flexible mounting options are the perfect choice for the industrial sector.

Software solutions

An extensive combination of SW’s are available to meet the needs of operators and researchers, looking for the best complement to analyze their measurement data. Guided solutions and automated procedures are ready to go along with the user, from sample navigation modules to the final Analysis and Reporting files.

General purpose systems

A wide range of non-contact 3D surface profilers are designed to be used in industry and research markets. All of them have been designed as a versatile systems able to measure different textures, structures, roughness and waviness, all across varying surface scales. Sensofar’s General Purpose systems are appropriate for a broad range of high-end surface measurement applications.

Integrable solutions

These integrable solutions put high-performance surface metrology right where you need it: in the application!
Our sensors have been designed right from the outset to be integrated into the harshest manufacturing environments.
Compact, lightweight, and with flexible mounting options are the perfect choice for the industrial sector.

Accuracy and repeatability

Standard Value U, σ Technique
Step height 48600 nm U=300 nm, σ= 10 nm Confocal & CSI
7616 nm U=79 nm, σ= 5 nm Confocal & CSI
941.6 nm
U=7 nm, σ= 1 nm Confocal & CSI
186 nm U=4 nm, σ= 0.4 nm Confocal & CSI
44.3 nm U=0.5 nm, σ= 0.1 nm PSI
10.8 nm U=0.5 nm, σ= 0.05 nm PSI
Areal roughness (Sa)7 0.79 µm U=0.04 µm, σ=0.0005 µm Confocal, AiFV & CSI
Profile roughness (Ra)8 2.40 µm U=0.03 µm, σ= 0.002 µm Confocal, AiFV & CSI
0.88 µm U=0.015 µm,σ= 0.0005 µm Confocal, AiFV & CSI
0.23 µm U=0.005 µm,σ= 0.0002 µm Confocal, AiFV & CSI
XYZ
Standard Value U, σ Technique
Step height 48600 nm U=300 nm, σ= 10 nm Confocal & CSI
7616 nm U=79 nm, σ= 5 nm Confocal & CSI
941.6 nm
U=7 nm, σ= 1 nm Confocal & CSI
186 nm U=4 nm, σ= 0.4 nm Confocal & CSI
44.3 nm U=0.5 nm, σ= 0.1 nm PSI
10.8 nm U=0.5 nm, σ= 0.05 nm PSI
Areal roughness (Sa)7 0.79 µm U=0.04 µm, σ=0.0005 µm Confocal, AiFV & CSI
Profile roughness (Ra)8 2.40 µm U=0.03 µm, σ= 0.002 µm Confocal, AiFV & CSI
0.88 µm U=0.015 µm,σ= 0.0005 µm Confocal, AiFV & CSI
0.23 µm U=0.005 µm,σ= 0.0002 µm Confocal, AiFV & CSI
Brightfield
Standard Value U, σ Technique
Step height 48600 nm U=300 nm, σ= 10 nm Confocal & CSI
7616 nm U=79 nm, σ= 5 nm Confocal & CSI
941.6 nm
U=7 nm, σ= 1 nm Confocal & CSI
186 nm U=4 nm, σ= 0.4 nm Confocal & CSI
44.3 nm U=0.5 nm, σ= 0.1 nm PSI
10.8 nm U=0.5 nm, σ= 0.05 nm PSI
Areal roughness (Sa)7 0.79 µm U=0.04 µm, σ=0.0005 µm Confocal, AiFV & CSI
Profile roughness (Ra)8 2.40 µm U=0.03 µm, σ= 0.002 µm Confocal, AiFV & CSI
0.88 µm U=0.015 µm,σ= 0.0005 µm Confocal, AiFV & CSI
0.23 µm U=0.005 µm,σ= 0.0002 µm Confocal, AiFV & CSI
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