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Low slope microlens array.
Low local slopes microlenses are well characterized with PSI technology that is able to use low magnifications while keeping high Z resolution and repeatability.
Microlens array of a Shack-Hartmann interferometer. FOV = 1 mm |
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High slope microlens array
High local slopes (up to 70º) measured with high numerical aperture. With the topography stitching is possible to measure large areas with high magnification optics.
Microlens array of a CCD imaging chip with 50XEPI objective. FOV = 0.25 mm² |
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Roughness
With the PSI technology it is possible to achieve 0.1 nm resolution and 0.03 nm repeatability for roughness evaluation at the apex of a lens.
Apex measure of the top of an ophthalmic lens after best sphere removal. FOV = 250 µm. Roughness = 0.3 nm. |
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Aspherical lens.
The software incorporates aspherical term automatic fitting for the radius, shape, Form error, and roughness evaluation.
Profile of a parabolic telescope mirror. Length = 100 mm |
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Coordinates
Large area profiling is achieved with the optional coordinate software. This software measures point by point any optical surface as large as the travel range of the stage. Each point is measured with a fast autofocus.
Coordinate measure of an ophthalmic lens in a spiral pattern. PV = 3 mm. FOV = 30 x 30 mm² |
