Coining
Large area measurement
(1 euro coin)
|
MEMs
High aspect ratio and
steep samples
(micro-accelerometer)
|
Paper
Low reflective and
rough surfaces
(worn paper)
|
Semiconductor
Nano-roughness and
nano-waviness measurement
(raw silicon wafer)
|
Chemical
Particle characterization
(metal particle on silicon substrate)
|
Material
Testing
Tribology, hardness
tests, fatigue, etc.
(inverted Vickers indentation)
|
Engineering
surfaces
Micro-roughness and
micro-waviness on metal mechanized surfaces
(milled aluminum)
|
ICs
Statistical height characterization
(IC - soldering tool)
|
